• Laser & Optoelectronics Progress
  • Vol. 60, Issue 3, 0312007 (2023)
Shulian Zhang* and Yuan Yang
Author Affiliations
  • State Key Laboratory of Precision Measurement Technology and Instruments, Tsinghua University, Beijing 100084, China
  • show less
    DOI: 10.3788/LOP223349 Cite this Article Set citation alerts
    Shulian Zhang, Yuan Yang. Research on the Key Technologies of Microchip Laser Common-Path Frequency-Modulation Feedback Interferometer[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312007 Copy Citation Text show less
    Principle of laser feedback and laser output intensity diagram[2]. (a) Principle of laser feedback; (b) laser feedback fringe, curve of laser intensity induced by mirror displacement
    Fig. 1. Principle of laser feedback and laser output intensity diagram[2]. (a) Principle of laser feedback; (b) laser feedback fringe, curve of laser intensity induced by mirror displacement
    Principle diagram of optical feedback frequency modulation and phase heterodyne measurement method for micro-chip laser[6]
    Fig. 2. Principle diagram of optical feedback frequency modulation and phase heterodyne measurement method for micro-chip laser[6]
    Output transverse mode of Nd∶YVO4 laser[7]
    Fig. 3. Output transverse mode of Nd∶YVO4 laser[7]
    Optical power spectrum and relaxation oscillation of the microchip laser[8]. (a) Single-longitudinal mode laser power spectrum, fRO; (b) dual-longitudinal mode laser power spectrum, fRO'; (c) optical power spectrum of single-longitudinal mode laser frequency shift feedback, modulated frequency f
    Fig. 4. Optical power spectrum and relaxation oscillation of the microchip laser[8]. (a) Single-longitudinal mode laser power spectrum, fRO; (b) dual-longitudinal mode laser power spectrum, fRO'; (c) optical power spectrum of single-longitudinal mode laser frequency shift feedback, modulated frequency f
    Relaxation oscillation frequency of Nd∶YVO4 laser and Nd∶GdVO4 laser as a function of relative pump level
    Fig. 5. Relaxation oscillation frequency of Nd∶YVO4 laser and Nd∶GdVO4 laser as a function of relative pump level
    Relationship of relaxation oscillation frequency with relative pump level at different cavity lengths
    Fig. 6. Relationship of relaxation oscillation frequency with relative pump level at different cavity lengths
    Variation of relaxation oscillation frequency with relative pump level under different reflectances of output mirror
    Fig. 7. Variation of relaxation oscillation frequency with relative pump level under different reflectances of output mirror
    Frequency stabilization of the microchip laser (size is 30 mm×30 mm×40 mm)[9]
    Fig. 8. Frequency stabilization of the microchip laser (size is 30 mm×30 mm×40 mm)[9]
    System configuration of the quasi common path, frequency multiplexing laser self-mixing interferometer[8]
    Fig. 9. System configuration of the quasi common path, frequency multiplexing laser self-mixing interferometer[8]
    Results of performance verification. (a) Zero drift characteristics of the system; (b) tested data of the system's displacement resolution
    Fig. 10. Results of performance verification. (a) Zero drift characteristics of the system; (b) tested data of the system's displacement resolution
    Micro-chip laser feedback interferometer, quasi-common-path dual microchip frequency multiplexing technology
    Fig. 11. Micro-chip laser feedback interferometer, quasi-common-path dual microchip frequency multiplexing technology
    Schematic diagram of two laser beams generated by two LD's directly pumping a piece of Nd∶YVO4 microchip laser
    Fig. 12. Schematic diagram of two laser beams generated by two LD's directly pumping a piece of Nd∶YVO4 microchip laser
    Laser transverse modes of the two beams
    Fig. 13. Laser transverse modes of the two beams
    Resolution of the quasi-common-path frequency-multiplexing microchip laser interferometer
    Fig. 14. Resolution of the quasi-common-path frequency-multiplexing microchip laser interferometer
    Zero drift measurement at the working distance of 10 m
    Fig. 15. Zero drift measurement at the working distance of 10 m
    Total frequency shift f is less than the relaxation oscillation frequency (oscilloscope display)
    Fig. 16. Total frequency shift f is less than the relaxation oscillation frequency (oscilloscope display)
    Total frequency shift f is greater than the relaxation oscillation frequency (oscilloscope display)
    Fig. 17. Total frequency shift f is greater than the relaxation oscillation frequency (oscilloscope display)
    Optical path structure of Nd∶YVO4 laser feedback confocal system
    Fig. 18. Optical path structure of Nd∶YVO4 laser feedback confocal system
    One-dimensional, two-dimensional, and three-dimensional tomography
    Fig. 19. One-dimensional, two-dimensional, and three-dimensional tomography
    Frequency domain and time domain signal of feedback light obtained by microchip feedback interferometer (target is sound box) [19]
    Fig. 20. Frequency domain and time domain signal of feedback light obtained by microchip feedback interferometer (target is sound box) [19]
    Waveform and spectrum of sound signal[19]. (a) Measured signal; (b) original signal
    Fig. 21. Waveform and spectrum of sound signal[19]. (a) Measured signal; (b) original signal
    Schematic diagram of two-dimensional displacement measurement by laser feedback of the micro-piece[20]
    Fig. 22. Schematic diagram of two-dimensional displacement measurement by laser feedback of the micro-piece[20]
    Measurement results of two-dimensional displacement[20]. (a) In-plane displacement resolution; (b) out-of-plane displacement resolution; (c) two-dimensional displacement range; (d) Lissajous graph trajectory
    Fig. 23. Measurement results of two-dimensional displacement[20]. (a) In-plane displacement resolution; (b) out-of-plane displacement resolution; (c) two-dimensional displacement range; (d) Lissajous graph trajectory
    Measurement device of material thermal expansion based on Nd∶YAG laser feedback interferometer[21]
    Fig. 24. Measurement device of material thermal expansion based on Nd∶YAG laser feedback interferometer[21]
    Refractive index and thickness measured by quasi common laser feedback interferometry[22]
    Fig. 25. Refractive index and thickness measured by quasi common laser feedback interferometry[22]
    No.Fused silicaCaF2ZnSe
    Refractive indexThickness /mmRefractive indexThickness /mmRefractive indexThickness /mm
    11.4496819.97461.4284519.82732.482789.8944
    21.4497219.97501.4284819.82762.482789.8950
    31.4496919.97601.4284819.82812.482789.8952
    41.4497319.97481.4284519.82872.482789.8949
    51.4496919.97521.4284619.82822.482789.8952
    61.4497219.97441.4284819.82832.482789.8952
    71.4497119.97521.4284619.82822.482789.8952
    81.4497219.97531.4284919.82842.482789.8951
    91.4497019.97571.4284619.82832.482789.8950
    101.4497319.97521.4284419.82822.482789.8949
    Table 1. Measurements of refractive index and thickness of fused quartz, calcium fluoride, and zinc selenide samples
    Shulian Zhang, Yuan Yang. Research on the Key Technologies of Microchip Laser Common-Path Frequency-Modulation Feedback Interferometer[J]. Laser & Optoelectronics Progress, 2023, 60(3): 0312007
    Download Citation