• Chinese Optics Letters
  • Vol. 19, Issue 3, 031101 (2021)
Jie Dai1、2, Lihua Huang1、2、*, Kai Guo1, Liqing Ling1, and Huijie Huang1、2
Author Affiliations
  • 1Laboratory of Information Optics and Optoelectronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/COL202119.031101 Cite this Article Set citation alerts
    Jie Dai, Lihua Huang, Kai Guo, Liqing Ling, Huijie Huang. Reflectance transformation imaging of 3D detection for subtle traces[J]. Chinese Optics Letters, 2021, 19(3): 031101 Copy Citation Text show less

    Abstract

    This paper reports a detection method of two-dimensional (2D) enhancement and three-dimensional (3D) reconstruction for subtle traces with reflectance transformation imaging, which can effectively locate the trace area of interest and extract the normal data of this area directly. In millimeter- and micron-scale traces, during 3D construction, we presented a method of data screening, conversion, and amplification, which can successfully suppress noise, improve surface and edge quality, and enhance 3D effect and contrast. The method not only captures 2D and 3D morphologies of traces clearly but also obtains the sizes of these traces.
    L=a0(u,v)lu2+a1(u,v)lv2+a2(u,v)lulv+a3(u,v)lu+a4(u,v)lv+a5(u,v),

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    [lu02lv02lu0lv0lu0lv01lu12lv12lu1lv1lu1lv11lu532lv532lu53lv53lu53lv531][a0a1a5]=[L0L1L53].

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    {lu0=a2a42a1a34a0a1a22lv0=a2a32a0a44a0a1a22N=(lu0,lv0,1lu02lv02).

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    {Zx=Zx=p,Zxx=Zxx=pxZy=Zy=q,Zyy=Zyy=qy.

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    E(Z;p,q)=(Zxp)2+(Zyq)2+λ[(Zxxpx)2+(Zyyqy)2].

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    const=E(Z;p,q)dxdy.

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    {p=nxnz+w×(nxnz+nx)q=nynz+w×(nynz+ny).

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    {p=p+k[p1d2(dpi)]q=q+k[q1d2(dqi)].

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    {P˜=[P(x,y)P(Nx,y)P(x,My)P(Nx,My)]Q˜=[Q(x,y)Q(Nx,y)Q(x,My)Q(Nx,My)].

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    R2=1i(ziz^i)2i(zizI¯)2,

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    Jie Dai, Lihua Huang, Kai Guo, Liqing Ling, Huijie Huang. Reflectance transformation imaging of 3D detection for subtle traces[J]. Chinese Optics Letters, 2021, 19(3): 031101
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