• Opto-Electronic Engineering
  • Vol. 33, Issue 7, 63 (2006)
1,2 and 1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Theory analyses of moiré stripe in 3-D profilometry measurement[J]. Opto-Electronic Engineering, 2006, 33(7): 63 Copy Citation Text show less
    References

    [1] Yoshiharu Morimoto,Harold E,Daniel Post.Carrier pattern analysis of moire interferometry using the Fourier transforms moiré method[J].Opt.Eng,1994,33(8):2646-2653.

    [2] Daniel Post.Moiré interferometry for engineering and science[J].Proc.SPIE,2005,5776:29-43.

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