• Opto-Electronic Engineering
  • Vol. 33, Issue 7, 63 (2006)
[in Chinese]1、2 and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Theory analyses of moiré stripe in 3-D profilometry measurement[J]. Opto-Electronic Engineering, 2006, 33(7): 63 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. Theory analyses of moiré stripe in 3-D profilometry measurement[J]. Opto-Electronic Engineering, 2006, 33(7): 63
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