[2] Wu W. Research on knowledge-based target recognition and tracking techniques[D]. Harbin: Harbin Institute of Technology, 10-28(2007).
Wu W. Research on knowledge-based target recognition and tracking techniques[D]. Harbin: Harbin Institute of Technology, 10-28(2007).
[5] Girshick R. Fast R-CNN. [C]∥2015 IEEE International Conference on Computer Vision (ICCV), December 7-13, 2015, Santiago, Chile. New York: IEEE, 1440-1448(2015).
Girshick R. Fast R-CNN. [C]∥2015 IEEE International Conference on Computer Vision (ICCV), December 7-13, 2015, Santiago, Chile. New York: IEEE, 1440-1448(2015).
[7] Dai J, Li Y, He K et al. R-FCN: object detection via region-based fully convolutional networks. [C]∥NIPS'16 Proceedings of the 30th International Conference on Neural Information Processing Systems, December 5-10, 2016, Barcelona, Spain. USA: Curran Associates Inc., 379-387(2016).
Dai J, Li Y, He K et al. R-FCN: object detection via region-based fully convolutional networks. [C]∥NIPS'16 Proceedings of the 30th International Conference on Neural Information Processing Systems, December 5-10, 2016, Barcelona, Spain. USA: Curran Associates Inc., 379-387(2016).
[8] Redmon J, Divvala S, Girshick R et al. You only look once: unified, real-time object detection. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 779-788(2016).
Redmon J, Divvala S, Girshick R et al. You only look once: unified, real-time object detection. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 779-788(2016).
[9] Liu W, Anguelov D, Erhan D et al. SSD: single shot multibox detector[M]. ∥Leibe B, Matas J, Sebe N,
Liu W, Anguelov D, Erhan D et al. SSD: single shot multibox detector[M]. ∥Leibe B, Matas J, Sebe N,
[11] Huang J, Rathod V, Sun C et al. Speed/accuracy trade-offs for modern convolutional object detectors. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 3296-3297(2017).
Huang J, Rathod V, Sun C et al. Speed/accuracy trade-offs for modern convolutional object detectors. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 3296-3297(2017).
[12] Lin T Y, Maire M, Belongie S et al. Microsoft COCO: common objects in context[M]. ∥Fleet D, Pajdla T, Schiele B,
Lin T Y, Maire M, Belongie S et al. Microsoft COCO: common objects in context[M]. ∥Fleet D, Pajdla T, Schiele B,
[13] Xu Y Z, Yao X J, Li X et al[J]. Object detection in high resolution remote sensing images based on fully convolution networks Bulletin of Surveying and Mapping, 2018, 77-82.
Xu Y Z, Yao X J, Li X et al[J]. Object detection in high resolution remote sensing images based on fully convolution networks Bulletin of Surveying and Mapping, 2018, 77-82.
[14] Zhang Z Y. Plane detection in optical remote sensing images based on deep learning[D]. Xiamen: Xiamen University, 20-30(2016).
Zhang Z Y. Plane detection in optical remote sensing images based on deep learning[D]. Xiamen: Xiamen University, 20-30(2016).
[17] Lin T Y, Dollár P, Girshick R et al. Feature pyramid networks for object detection. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 936-944(2017).
Lin T Y, Dollár P, Girshick R et al. Feature pyramid networks for object detection. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 936-944(2017).
[18] Huang G, Liu Z. Maaten L V D, et al. Densely connected convolutional networks. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 2261-2269(2017).
Huang G, Liu Z. Maaten L V D, et al. Densely connected convolutional networks. [C]∥2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), July 21-26, 2017, Honolulu, HI, USA. New York: IEEE, 2261-2269(2017).
[19] Simonyan K. -04-10)[2018-12-22]. https: ∥arxiv., org/abs/1409, 1556(2015).
Simonyan K. -04-10)[2018-12-22]. https: ∥arxiv., org/abs/1409, 1556(2015).
[20] Ioffe S, Szegedy C. Batch normalization: accelerating deep network training by reducing internal covariate shift. [C]∥ICML'15 Proceedings of the 32nd International Conference on International Conference on Machine Learning, July 6-11, 2015, Lille, France. Massachusetts: JMLR. org, 448-456(2015).
Ioffe S, Szegedy C. Batch normalization: accelerating deep network training by reducing internal covariate shift. [C]∥ICML'15 Proceedings of the 32nd International Conference on International Conference on Machine Learning, July 6-11, 2015, Lille, France. Massachusetts: JMLR. org, 448-456(2015).
[21] He K M, Zhang X Y, Ren S Q et al. Deep residual learning for image recognition. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 770-778(2016).
He K M, Zhang X Y, Ren S Q et al. Deep residual learning for image recognition. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 770-778(2016).
[24] Yosinski J, Clune J, Bengio Y et al. -11-06)[2018-12-22]. https:∥arxiv., org/abs/1411, 1792(2014).
Yosinski J, Clune J, Bengio Y et al. -11-06)[2018-12-22]. https:∥arxiv., org/abs/1411, 1792(2014).
[26] Loshchilov I. -03-03)[2018-12-25]. https:∥arxiv., org/abs/1608, 03983(2017).
Loshchilov I. -03-03)[2018-12-25]. https:∥arxiv., org/abs/1608, 03983(2017).
[27] Szegedy C, Vanhoucke V, Ioffe S et al. Rethinking the inception architecture for computer vision. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 2818-2826(2016).
Szegedy C, Vanhoucke V, Ioffe S et al. Rethinking the inception architecture for computer vision. [C]∥2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), June 27-30, 2016, Las Vegas, NV, USA. New York: IEEE, 2818-2826(2016).