• Opto-Electronic Engineering
  • Vol. 38, Issue 12, 94 (2011)
ZHANG Yao-ping1、2、*, ZHOU Hong1、2、3, FAN Jun-qi1、2, and XU Hong1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2011.12.018 Cite this Article
    ZHANG Yao-ping, ZHOU Hong, FAN Jun-qi, XU Hong. 10.6 μm Reflecting Coatings on Bimorph Mirror[J]. Opto-Electronic Engineering, 2011, 38(12): 94 Copy Citation Text show less
    References

    [1] NING Yu, JIANG Wen-han, LING Ning, et al. Analysis on the influencing factors of deformation in bimorph deformable mirror [J]. Proc. of SPIE(S0277-786X), 2007, 6724: 1-5.

    [2] ZHOU Hong, NING Yu, GUAN Chun-lin, et al. Design and Fabrication of Deformable Prototype for Bimorph Mirrors [J]. Acta Optica Sinica, 2009, 29(6): 1437-1442.

    [3] Lee J H, Gho H S, Hyu J, et al. Study of a Circular Bimorph Deformable Mirror for Circular/Annulus/Square Laser Beam Compensation [J]. Proc. of SPIE(S0277-786X), 2007, 5639: 46-52.

    [5] Vadim Samaxkin, Alexander Aleksandrov, Alexis Kudryashov. Bimorph mirrors for powerful laser beam correction and formation [J]. Proc. of SPIE(S0277-786X), 2002, 4493: 269-276.

    [6] LING Ning, GUAN Chun-lin, WANG Lan, et al. The development of 61-element discrete piezoelectric deformable mirror [J]. High Power Laser and Particle Beams, 1998, 10(4): 527-530.

    [7] ZENG Zhi-ge, LING Ning, RAO Xue-jun. Analysis for the finite element of the active thin mirror surface [J]. Opto-Electronic Engineering, 1995, 22(2): 8-19.

    [8] LING Ning, GUAN Chun-lin, WANG Lan, et al. The development of 61-element discrete piezoelectric deformable mirror [J]. High Power Laser and Particle Beams, 1998, 10(4): 527-530.

    [9] ZHANG Yao-ping, XU Hong, ZHANG Yun-dong, et al. The study on finite element analysis of the residual stress of thin film and component of deformable mirror [J]. Opto-Electronic Engineering, 2005, 32(8): 28-31.

    ZHANG Yao-ping, ZHOU Hong, FAN Jun-qi, XU Hong. 10.6 μm Reflecting Coatings on Bimorph Mirror[J]. Opto-Electronic Engineering, 2011, 38(12): 94
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