• Chinese Optics Letters
  • Vol. 14, Issue 8, 081202 (2016)
Meng-Chang Hsieh1、*, Jiun-You Lin2, and Chia-Ou Chang1、3
Author Affiliations
  • 1Institute of Applied Mechanics, National Taiwan University, Taipei 10617, China
  • 2Department of Mechatronics Engineering, National Changhua University of Education, Changhua 500, China
  • 3College of Mechanical Engineering, Guangxi University, Nanning 530004, China
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    DOI: 10.3788/COL201614.081202 Cite this Article Set citation alerts
    Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang. Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry[J]. Chinese Optics Letters, 2016, 14(8): 081202 Copy Citation Text show less
    Schematic diagram of the wavelength shifts measurement architecture.
    Fig. 1. Schematic diagram of the wavelength shifts measurement architecture.
    Relation curve of phase difference and wavelength.
    Fig. 2. Relation curve of phase difference and wavelength.
    Theoretical simulation of sensitivity versus wavelength.
    Fig. 3. Theoretical simulation of sensitivity versus wavelength.
    Theoretical simulation of resolution Δλerr versus wavelength.
    Fig. 4. Theoretical simulation of resolution Δλerr versus wavelength.
    Relation curve of phase difference and wavelength of the diffraction beam with different orders.
    Fig. 5. Relation curve of phase difference and wavelength of the diffraction beam with different orders.
    Uncertainty errorsPhase errors (deg.)Note
    The SHE0.02The resolution of the polarimeter (for calibrating the POL, ANr, and ANt) in this experiment was 0.5°
    The PME0.35The PME (the extinction ratio of the polarizer was 105) was predictable and could be deduced[20].
    The ARLIA0.01
    The GPE0.22The theoretical calculation based on 3% period errors (632 to 633 nm, Δλ=1nm)
    Table 1. Uncertainty Errors
    Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang. Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry[J]. Chinese Optics Letters, 2016, 14(8): 081202
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