Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng-Chang Hsieh; Jiun-You Lin; Chia-Ou Chang

doi:10.3788/COL201614.081202

Journals >Chinese Optics Letters >Volume 14 >Issue 8 >Page 081202 > Article

Chinese Optics Letters
Vol. 14, Issue 8, 081202 (2016)

Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

Meng-Chang Hsieh^1、*, Jiun-You Lin², and Chia-Ou Chang^1、3

Author Affiliations

¹Institute of Applied Mechanics, National Taiwan University, Taipei 10617, China

²Department of Mechatronics Engineering, National Changhua University of Education, Changhua 500, China

³College of Mechanical Engineering, Guangxi University, Nanning 530004, China

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DOI: 10.3788/COL201614.081202 Cite this Article Set citation alerts

Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang. Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry[J]. Chinese Optics Letters, 2016, 14(8): 081202 Copy Citation Text

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Meng-Chang Hsieh, Jiun-You Lin, Chia-Ou Chang. Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry[J]. Chinese Optics Letters, 2016, 14(8): 081202

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