[1] A K Burnham, M J Runkel, S G Demos, et al.. Effect of vacuum on the occurrence of UV- induced surface photoluminescence, transmission loss, and catastrophic surface damage[C]. SPIE, 2000, 4134: 243-252.
[2] D N Nguyen, L A Emmert, W Rudolph, et al.. Studies of femtosecond laser induced damage of HfO2 thin film in atmospheric and vacuum environments[C]. SPIE, 2009, 7504: 750403.
[3] S Z Xu, X T Zu, X D Jiang, et al.. The damage mechanisms of fused silica irradiated by 355 nm laser in vacuum[J]. Nuclear Instruments and Methods in Physics Research B, 2008, 266(12-13): 2936-2940.
[4] W Riede, P Allenspacher, Laser damage test bench for space optics[C]. ICSO, 2004: 839-843.
[5] D Jolly. Manufacturing experience in reducing environmental induced failures of laser diodes[C]. SPIE, 1996, 2714: 679-682.
[6] S Papernov, A W Schmid. Testing asymmetry in plasma-ball growth seeded by a nanoscale absorbing defect embedded in a SiO2 thin-film matrix subjected to UV pulsed-laser radiation[J]. J Appl Phys, 2008, 104(6): 063101.
[7] S Papernova, A W Schmid. Two mechanisms of crater formation in ultraviolet- pulsed- laser irradiated SiO2 thin films with artificial defects[J]. J Appl Phys, 2005, 97(11): 114906.
[8] C W Carr, H B Radousky, A M Rubenchik, et al.. Localized dynamics during laser-induced damage in optical materials [J]. Phys Rev Lett, 2004, 92(8): 087401.
[9] S Papernova, A W Schmid. Correlations between embedded single gold nanoparticles in SiO2 thin film and nanoscale crater formation induced by pulsed-laser radiation[J]. J Appl Phys, 2002, 92(10): 5720-5728.
[10] M Ziman. Principles of the Theory of Solids (2nd Edition) [M]. London, New York, Melbourne: Cambridge University Press, 1979: 43-44.
[11] D W Song, W N Shen, B Dunn, et al.. Thermal conductivity of nanoporous bismuth thin films[J]. Appl Phys Lett, 2004, 84(11): 1883-1885.
[12] Feng Xiaoli, Li Zhixin, Liang Xin′gang, et al.. Moleculer dynamics simulation of thermal conductivity of nano-films[J]. Chinese Science Bulletin, 2000, 45(19): 2113-2117.
[13] Tang Jingfa, Gu Peifu, Liu Xu, et al.. Modern Optical Thin Film Technology[M]. Hangzhou: Zhejiang University Press, 2006: 296-297.
[14] A Bananej, A assanpour, H Razzaghi, et al.. The effect of porosity on the laser induced damage threshold of TiO2 and ZrO2 single layer films[J]. Opt Laser Technol, 2010, 42(8): 1187-1192.
[15] G Gesele, L Linsmeier, V Drach, et al.. Temperature- dependent thermal conductivity of porous silicon[J]. J Phys D: Appl Phys, 1997, 30(21): 2911-2916.
[16] A H Guenther, J K Mciver. The role of thermal conductivity in the pulsed laser damage sensitivity of optical thin films [J]. Thin Solid Films, 1988, 163: 203-214.
[17] Hu Haiyang. Study on Thermal- Mechanical Damage of Optical Thin Film[D]. Shanghai Institute of Optics and Fine Mechanics of the Chinese Academy of Sciences, 2003: 50-52.
[18] Z L Xia, Z X Fan, J D Shao. Statistical approach to bulk inclusion initialized damage in films[J]. Opt Commun, 2006, 265(2): 620-627.
