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    Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 5 >Page 53101 > Article
    • Laser & Optoelectronics Progress
    • Vol. 52, Issue 5, 53101 (2015)
    Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments
    Ling Xiulan1、*, Wang Gao1, and Liu Xiaofeng2
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  • 2[in Chinese]
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    DOI: 10.3788/lop52.053101 Cite this Article Set citation alerts
    Ling Xiulan, Wang Gao, Liu Xiaofeng. Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments[J]. Laser & Optoelectronics Progress, 2015, 52(5): 53101 Copy Citation Text show less
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    Ling Xiulan, Wang Gao, Liu Xiaofeng. Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments[J]. Laser & Optoelectronics Progress, 2015, 52(5): 53101
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