By the wavelet transform profilometry, the height distribution of an object can be obtained by calculating the wavelet coefficient of the deformed fringe pattern at the “ridge” position even there are some frequency overlaps between the fundamental frequency and the higher-order spectra. It provides a way to overcome the shortcoming of Fourier transform profilometry. But by now the discussion of the measurement range of wavelet transform profilometry has not been done yet. The frequency-domain description of wavelet coefficient is deduced from the point of view of the frequency analysis. And the measurement range of the wavelet transform profilometry is discussed, including the structure condition of the measurement system and the sampling condition introduced by digitizing the deformed fringe. A conclusion has been made that as long as there aren't any instantaneous frequency overlapping, both within a frequency island and between the adjacent periods, the correct reconstruction can be obtained by wavelet transform profilometry. In another word, under conditions that the instantaneous height variation of the test object in the fringe pattern at any position satisfies h/xx=b<1/3 and the number m of sampling points in one period must be greater or equal to 3, the correct phase included in the deformed fringe pattern can be retrieved by this method.