Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001
- Acta Optica Sinica
- Vol. 38, Issue 6, 0624001 (2018)
Fig. 1. (a) SEM image of 200 nm polystyrene nanoparticle distribution; (b) SEM image of single nanoparticle
Fig. 2. (a) Schematic of imaging setup based on TIR evanescent wave excitation; (b) schematic of imaging setup based on SPPs excitation; (c) variation of TIR reflectance with incident angle; (d) variation of SPPs reflectance with incident angle
Fig. 3. Imaging of single polystyrene nanoparticle with the diameter of (a) 500 nm, (b) 200 nm and (c) 100 nm based on TIR evanescent wave; imaging of single polystyrene nanoparticle with the diameter of (d) 500 nm, (e) 200 nm and (f) 100 nm based on SPPs
Fig. 4. Spatial distribution simulation of |E→|2. (a) TIR; (b) SPPs
Fig. 5. Comparison of the polarization intensity of single polystyrene nanoparticle with TIR evanescent wave and SPPs
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