Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang; Xuqing Sun; Hongyao Liu; Yaqin Chen; Wei Xiong; Chaoqian Zhang; Xinchao Lu

doi:10.3788/AOS201838.0624001

Journals >Acta Optica Sinica >Volume 38 >Issue 6 >Page 0624001 > Article

Acta Optica Sinica
Vol. 38, Issue 6, 0624001 (2018)

Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering

Liwen Jiang^1、2, Xuqing Sun¹, Hongyao Liu¹, Yaqin Chen¹, Wei Xiong¹, Chaoqian Zhang¹, and Xinchao Lu^1、3、*

Author Affiliations

¹ Microelectronic Instrument and Equipment Center, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China

² University of Chinese Academy of Sciences, Beijing 100049, China

³ Beijing Key Laboratory of IC Test Technology, Beijing 100088, China

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DOI: 10.3788/AOS201838.0624001 Cite this Article Set citation alerts

Liwen Jiang, Xuqing Sun, Hongyao Liu, Yaqin Chen, Wei Xiong, Chaoqian Zhang, Xinchao Lu. Single Nanoparticle Label-Free Imaging Based on Evanescent Wave In-Plane Scattering[J]. Acta Optica Sinica, 2018, 38(6): 0624001 Copy Citation Text

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