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    Journals >Acta Optica Sinica >Volume 2 >Issue 1 >Page 79 > Article
    • Acta Optica Sinica
    • Vol. 2, Issue 1, 79 (1982)
    A reticle method for exactly measuring Gaussian optical spot parameter
    XU SHENLONG and YIN DAREN
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    XU SHENLONG, YIN DAREN. A reticle method for exactly measuring Gaussian optical spot parameter[J]. Acta Optica Sinica, 1982, 2(1): 79 Copy Citation Text show less
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    XU SHENLONG, YIN DAREN. A reticle method for exactly measuring Gaussian optical spot parameter[J]. Acta Optica Sinica, 1982, 2(1): 79
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