• Laser & Optoelectronics Progress
  • Vol. 57, Issue 5, 051201 (2020)
Yixiang Zhang and Lianxin Zhang*
Author Affiliations
  • Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    DOI: 10.3788/LOP57.051201 Cite this Article Set citation alerts
    Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201 Copy Citation Text show less
    Experimental setup
    Fig. 1. Experimental setup
    Reflection model of object surface
    Fig. 2. Reflection model of object surface
    Relationship between intensity and rotation angle of polarizer
    Fig. 3. Relationship between intensity and rotation angle of polarizer
    Main procedure of ICA
    Fig. 4. Main procedure of ICA
    Newton iteration algorithm
    Fig. 5. Newton iteration algorithm
    Flow chart of experiment
    Fig. 6. Flow chart of experiment
    Distortion fringe image
    Fig. 7. Distortion fringe image
    Polarization images at different rotation angles. (a) Polarization image at 20°; (b) polarization image at 40°; (c) polarization image at 60°
    Fig. 8. Polarization images at different rotation angles. (a) Polarization image at 20°; (b) polarization image at 40°; (c) polarization image at 60°
    Separation images using ICA. (a) Specular components; (b) diffuse components
    Fig. 9. Separation images using ICA. (a) Specular components; (b) diffuse components
    Reconstructed result of traditional projected fringe profilometry
    Fig. 10. Reconstructed result of traditional projected fringe profilometry
    Reconstructed result of ICA algorithm
    Fig. 11. Reconstructed result of ICA algorithm
    ConditionTraditionalmethodICA
    Radius sizeActual length
    Larger radius126.18126.59126.39
    Smaller radius123.94124.32124.12
    Table 1. Fitting results of valid data obtained by two methodsmm
    Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201
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