A method that combines projected fringe profilometry with independent component analysis (ICA) is proposed to realize the three-dimensional profile measurement of high-reflective surfaces. The reflection model and characteristics of reflection light from high-reflective surfaces are analyzed. The reflection light is mainly composed of specular and diffuse components. Considering the polarization property of the specular light, we put a polarizer before the CCD camera to eliminate the specular light primarily. Then, the polarization images at different angles can be captured by rotating the polarizer, and the separation of specular and diffuse components can be realized by using the reflection model combined with ICA. Finally, the images of diffuse components can be applied to the three-dimensional reconstruction. A smooth aluminum alloy sheet is measured, and the feasibility of the proposed method is verified.