• Laser & Optoelectronics Progress
  • Vol. 57, Issue 21, 212302 (2020)
Xiao Pingping*, Wang Fei, and Deng Manlan
Author Affiliations
  • 宜春学院物理科学与工程技术学院电子信息工程系, 江西 宜春 336000
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    DOI: 10.3788/LOP57.212302 Cite this Article Set citation alerts
    Xiao Pingping, Wang Fei, Deng Manlan. Nanometer Gap Measurement Based on Metal-Cladding Waveguide Configurations[J]. Laser & Optoelectronics Progress, 2020, 57(21): 212302 Copy Citation Text show less
    Schematic of sensing structure
    Fig. 1. Schematic of sensing structure
    Relationship between κ0h0 and effective refractive index for symmetrical metal-cladding waveguide structure
    Fig. 2. Relationship between κ0h0 and effective refractive index for symmetrical metal-cladding waveguide structure
    Relation between reflectivity and incident angle under different air gap thicknesses without organic film
    Fig. 3. Relation between reflectivity and incident angle under different air gap thicknesses without organic film
    Simulated R-θ curves when air gap thickness is 0 nm and 100 nm, respectively
    Fig. 4. Simulated R-θ curves when air gap thickness is 0 nm and 100 nm, respectively
    Relationship between air gap thickness and corresponding resonance angle
    Fig. 5. Relationship between air gap thickness and corresponding resonance angle
    Relationship between air gap thickness in the range of 0--10 nm with corresponding resonance angle
    Fig. 6. Relationship between air gap thickness in the range of 0--10 nm with corresponding resonance angle
    Xiao Pingping, Wang Fei, Deng Manlan. Nanometer Gap Measurement Based on Metal-Cladding Waveguide Configurations[J]. Laser & Optoelectronics Progress, 2020, 57(21): 212302
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