Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility

Huaina Yu; Zhenhua Chen; Xiangyu Meng; Yong Wang; Ying Zou; Renzhong Tai; Yuting Nie; Xuhui Sun

doi:10.3788/COL201513.S23401

Journals >Chinese Optics Letters >Volume 13 >Issue Suppl. >Page S23401 > Article

Chinese Optics Letters
Vol. 13, Issue Suppl., S23401 (2015)

Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility

Huaina Yu¹, Zhenhua Chen¹, Xiangyu Meng¹, Yong Wang^1、*, Ying Zou^1、**, Renzhong Tai^1、***, Yuting Nie², and Xuhui Sun²

Author Affiliations

¹Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China

²Institute of Functional Nano and Soft Materials (FUNSOM) and Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices, Soochow University, Suzhou 215123, China

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DOI: 10.3788/COL201513.S23401 Cite this Article Set citation alerts

Huaina Yu, Zhenhua Chen, Xiangyu Meng, Yong Wang, Ying Zou, Renzhong Tai, Yuting Nie, Xuhui Sun. Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility[J]. Chinese Optics Letters, 2015, 13(Suppl.): S23401 Copy Citation Text

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