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    Journals >Chinese Optics Letters >Volume 13 >Issue Suppl. >Page S23401 > Article
    • Chinese Optics Letters
    • Vol. 13, Issue Suppl., S23401 (2015)
    Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility
    Huaina Yu1, Zhenhua Chen1, Xiangyu Meng1, Yong Wang1、*, Ying Zou1、**, Renzhong Tai1、***, Yuting Nie2, and Xuhui Sun2
    Author Affiliations
  • 1Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China
  • 2Institute of Functional Nano and Soft Materials (FUNSOM) and Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices, Soochow University, Suzhou 215123, China
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    DOI: 10.3788/COL201513.S23401 Cite this Article Set citation alerts
    Huaina Yu, Zhenhua Chen, Xiangyu Meng, Yong Wang, Ying Zou, Renzhong Tai, Yuting Nie, Xuhui Sun. Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility[J]. Chinese Optics Letters, 2015, 13(Suppl.): S23401 Copy Citation Text show less
    Schematic diagram of the NEXAFS-XEOL detection system.
    Fig. 1. Schematic diagram of the NEXAFS-XEOL detection system.
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    Picture of the NEXAFS-XEOL setup in the experimental chamber.
    Fig. 2. Picture of the NEXAFS-XEOL setup in the experimental chamber.
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    (a) 2D NEXAFS-XEOL mapping across the O K-edge shown with the corresponding TEY spectrum, (b) XEOL spectra taken across the O K-edge from Fig. 3(a) , and (c) the PLY spectra recorded at two wavelengths, 380 nm (in red) and 531.3 nm (in blue), and the zero order PLY spectrum (in green) of a nanostructured ZnO sample, compared with the TEY spectrum (in black).
    Fig. 3. (a) 2D NEXAFS-XEOL mapping across the O K-edge shown with the corresponding TEY spectrum, (b) XEOL spectra taken across the O K-edge from Fig. 3(a) , and (c) the PLY spectra recorded at two wavelengths, 380 nm (in red) and 531.3 nm (in blue), and the zero order PLY spectrum (in green) of a nanostructured ZnO sample, compared with the TEY spectrum (in black).
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    Luminescence of anatase TiO2 nanopowder across the O K-edge: (a) the XEOL spectra under selected excitation energies and (b) the PLY (zero-order) spectrum compared with the TEY spectrum.
    Fig. 4. Luminescence of anatase TiO2 nanopowder across the O K-edge: (a) the XEOL spectra under selected excitation energies and (b) the PLY (zero-order) spectrum compared with the TEY spectrum.
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    Luminescence of anatase TiO2 nanopwder across the Ti L3,2-edge: (a) the XEOL spectra under selected excitation energies and (b) the PLY (zero-order) spectrum in comparison with the TEY spectrum.
    Fig. 5. Luminescence of anatase TiO2 nanopwder across the Ti L3,2-edge: (a) the XEOL spectra under selected excitation energies and (b) the PLY (zero-order) spectrum in comparison with the TEY spectrum.
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    Huaina Yu, Zhenhua Chen, Xiangyu Meng, Yong Wang, Ying Zou, Renzhong Tai, Yuting Nie, Xuhui Sun. Development of a XEOL detection system for the scanning transmission X-ray microscopy beamline at the Shanghai Synchrotron Radiation Facility[J]. Chinese Optics Letters, 2015, 13(Suppl.): S23401
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