Imaging Electron Optics of Electrostatic Focusing Concentric Spherical System Part B: Paraxial Lateral Chromatic Aberration and Geometrical Lateral Spherical Aberration

Liwei Zhou

doi:10.3788/AOS202242.0811002

Journals >Acta Optica Sinica >Volume 42 >Issue 8 >Page 0811002 > Article

Acta Optica Sinica
Vol. 42, Issue 8, 0811002 (2022)

Imaging Electron Optics of Electrostatic Focusing Concentric Spherical System Part B: Paraxial Lateral Chromatic Aberration and Geometrical Lateral Spherical Aberration

Liwei Zhou^*

Author Affiliations

School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China

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DOI: 10.3788/AOS202242.0811002 Cite this Article Set citation alerts

Liwei Zhou. Imaging Electron Optics of Electrostatic Focusing Concentric Spherical System Part B: Paraxial Lateral Chromatic Aberration and Geometrical Lateral Spherical Aberration[J]. Acta Optica Sinica, 2022, 42(8): 0811002 Copy Citation Text

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Fig. 1. Paraxial lateral chromatic aberration and geometrical lateral spherical aberration

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Fig. 2. Electron trajectory and paraxial lateral chromatic aberration in proximity focusing system (n=1)

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