Quantum Analysis and Measurement for Transient Spectrum

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 21 >Issue 7 >Page 825 > Article

Acta Optica Sinica
Vol. 21, Issue 7, 825 (2001)

Quantum Analysis and Measurement for Transient Spectrum

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Quantum Analysis and Measurement for Transient Spectrum[J]. Acta Optica Sinica, 2001, 21(7): 825 Copy Citation Text

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References

[3] Richard L L. Photoelectronic Imaging Devices. New York: Plenum Press, 1971. 66～80

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Quantum Analysis and Measurement for Transient Spectrum[J]. Acta Optica Sinica, 2001, 21(7): 825

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