Quantum Analysis and Measurement for Transient Spectrum

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 21 >Issue 7 >Page 825 > Article

Acta Optica Sinica
Vol. 21, Issue 7, 825 (2001)

Quantum Analysis and Measurement for Transient Spectrum

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

show less

DOI: Cite this Article Set citation alerts

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Quantum Analysis and Measurement for Transient Spectrum[J]. Acta Optica Sinica, 2001, 21(7): 825 Copy Citation Text

show less

Abstract

A recently developed Transient spectrum measurement instrument is introduced. Quantum conversion process of transient light spectrum measuring is analysed in detail, and a S/N expression of transient light spectrum, image parameters, electron optic imaging and effect of CCD lightsensitive surface are described. Finally, the measured spectrum curves are given.

Keywords

CCD detection electron optic imaging quantum analysis transient spectrum

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Quantum Analysis and Measurement for Transient Spectrum[J]. Acta Optica Sinica, 2001, 21(7): 825

Download Citation

Set citation alerts for the article

Tools

Set citation alerts for the article

Save the article for my favorites

Paper Information