• Laser & Optoelectronics Progress
  • Vol. 58, Issue 1, 133001 (2021)
Xu Peng1、2、3、*, Zhang Keqi1, Zhang Haijun2, Mao Lei1, Qiu Yuanfang1, and Zeng Zhi1
Author Affiliations
  • 1Ningbo Yongxin Optics Co., Ltd., Ningbo, Zhejiang 315040, China
  • 2College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China
  • 3Jiyang College of Zhejiang A&F University, Zhuji, Zhejiang 311800, China
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    DOI: 10.3788/LOP202158.0133001 Cite this Article Set citation alerts
    Xu Peng, Zhang Keqi, Zhang Haijun, Mao Lei, Qiu Yuanfang, Zeng Zhi. Colorimetric Characterization of Digital Reflection Microscope Based on Non-RAW Data[J]. Laser & Optoelectronics Progress, 2021, 58(1): 133001 Copy Citation Text show less
    References

    [1] Kim S J, Lin H T, Lu Z et al. A new in-camera imaging model for color computer vision and its application[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 34, 2289-2302(2012). http://ieeexplore.ieee.org/document/6158647/references

    [2] Hong G W, Luo M R, Rhodes P A. A study of digital camera colorimetric characterization based on polynomial modeling[J]. Color Research & Application, 26, 76-84(2001).

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    [10] Mitsunaga T, Nayar S K. Radiometric self calibration[C]//Proceedings of 1999 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (Cat. No PR00149), June 23-25, 1999, Fort Collins, CO, USA., 374-380(1999).

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    Xu Peng, Zhang Keqi, Zhang Haijun, Mao Lei, Qiu Yuanfang, Zeng Zhi. Colorimetric Characterization of Digital Reflection Microscope Based on Non-RAW Data[J]. Laser & Optoelectronics Progress, 2021, 58(1): 133001
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