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Journals >
Laser & Optoelectronics Progress >
Volume 58 >
Issue 1 >
Page 133001 > Article
Laser & Optoelectronics Progress
Vol. 58, Issue 1, 133001 (2021)
Colorimetric Characterization of Digital Reflection Microscope Based on Non-RAW Data
Xu Peng
1、2、3、*
, Zhang Keqi
1
, Zhang Haijun
2
, Mao Lei
1
, Qiu Yuanfang
1
, and Zeng Zhi
1
Author Affiliations
1
Ningbo Yongxin Optics Co., Ltd., Ningbo, Zhejiang 315040, China
2
College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China
3
Jiyang College of Zhejiang A&F University, Zhuji, Zhejiang 311800, China
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DOI:
10.3788/LOP202158.0133001
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Xu Peng, Zhang Keqi, Zhang Haijun, Mao Lei, Qiu Yuanfang, Zeng Zhi. Colorimetric Characterization of Digital Reflection Microscope Based on Non-RAW Data[J]. Laser & Optoelectronics Progress, 2021, 58(1): 133001
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Xu Peng, Zhang Keqi, Zhang Haijun, Mao Lei, Qiu Yuanfang, Zeng Zhi. Colorimetric Characterization of Digital Reflection Microscope Based on Non-RAW Data[J]. Laser & Optoelectronics Progress, 2021, 58(1): 133001
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Paper Information
Category: Vision, Color, and Visual Optics
Received: Apr. 14, 2020
Accepted: --
Published Online: Jan. 1, 2021
The Author Email: Peng Xu (xsjzxp@163.com)
DOI:
10.3788/LOP202158.0133001
Recommended Topics
laser devices and laser physics
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