• Acta Optica Sinica
  • Vol. 43, Issue 5, 0511001 (2023)
Meirui Chen1, Lü Jiang2, Hongmin Mao1, Huijuan Sun3, Jiantao Peng4, Guoding Xu1, Lifa Hu2, Huanjun Lu1、*, and Zhaoliang Cao1、**
Author Affiliations
  • 1Jiangsu Key Laboratory of Micro and Nano Heat Fluid Flow Technology and Energy Application, School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu, China
  • 2School of Science, Jiangnan University, Wuxi 214122, Jiangsu, China
  • 3Institute of Mathematics and Physics, Beijing Union University, Beijing 100101, China
  • 4Shanghai Institute of Satellite Engineering, China Aerospace Science and Technology Corporation, Shanghai 201109, China
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    DOI: 10.3788/AOS221604 Cite this Article Set citation alerts
    Meirui Chen, Lü Jiang, Hongmin Mao, Huijuan Sun, Jiantao Peng, Guoding Xu, Lifa Hu, Huanjun Lu, Zhaoliang Cao. High-Precision Static Aberration Correction Method of SPGD Algorithm[J]. Acta Optica Sinica, 2023, 43(5): 0511001 Copy Citation Text show less
    Optical path for static aberration correction
    Fig. 1. Optical path for static aberration correction
    Flow chart of SPGD algorithm
    Fig. 2. Flow chart of SPGD algorithm
    Scheme of performance metrics combination method
    Fig. 3. Scheme of performance metrics combination method
    Flow chart of performance metrics combination method
    Fig. 4. Flow chart of performance metrics combination method
    Simulated results of distorted image. (a) First 36 Zernike coefficients; (b) distorted wavefront; (c) far-field intensity distribution
    Fig. 5. Simulated results of distorted image. (a) First 36 Zernike coefficients; (b) distorted wavefront; (c) far-field intensity distribution
    Far-field intensity distributions after EE correction. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d
    Fig. 6. Far-field intensity distributions after EE correction. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d
    Intensity distributions of horizontal centerline of target surface. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d
    Fig. 7. Intensity distributions of horizontal centerline of target surface. (a) DEE=0.5d; (b) DEE=d; (c) DEE=1.5d; (d) DEE=2d; (e) DEE=2.5d; (f) DEE=3d
    Relationship between corrected SR and encircled diameter
    Fig. 8. Relationship between corrected SR and encircled diameter
    Correction results for MR. (a) Convergence curve; (b) residual wavefront; (c) far-field intensity distribution
    Fig. 9. Correction results for MR. (a) Convergence curve; (b) residual wavefront; (c) far-field intensity distribution
    Corrected results of MR method for 10 times repetition. (a) SR; (b) RMS of residual wavefront
    Fig. 10. Corrected results of MR method for 10 times repetition. (a) SR; (b) RMS of residual wavefront
    Performance metric convergence curve of combination method
    Fig. 11. Performance metric convergence curve of combination method
    Comparison of simulation correction results. (a)-(c) Residual wavefront; (d)-(f) far-field intensity distributions; (g)-(i) intensity distributions of horizontal centerline of target surface
    Fig. 12. Comparison of simulation correction results. (a)-(c) Residual wavefront; (d)-(f) far-field intensity distributions; (g)-(i) intensity distributions of horizontal centerline of target surface
    Comparison of different noise simulation correction results. (a)-(d) Weak noise with gray level of 80; (e)-(h) strong noise with gray level of 1200
    Fig. 13. Comparison of different noise simulation correction results. (a)-(d) Weak noise with gray level of 80; (e)-(h) strong noise with gray level of 1200
    Correction results of EE, MR, and performance index combination method for different noises
    Fig. 14. Correction results of EE, MR, and performance index combination method for different noises
    Correction results of EE method and performance index combination method for different encircled diameters. (a) SR; (b) RMS of residual wavefront
    Fig. 15. Correction results of EE method and performance index combination method for different encircled diameters. (a) SR; (b) RMS of residual wavefront
    Correction results of multiple random static aberrations. (a) SR; (b) RMS of residual wavefront
    Fig. 16. Correction results of multiple random static aberrations. (a) SR; (b) RMS of residual wavefront
    Optical path of static aberration correction system
    Fig. 17. Optical path of static aberration correction system
    Experimental results of static aberration correction. (a)-(d) Images of point object; (e)-(h) intensity distributions in center line of images
    Fig. 18. Experimental results of static aberration correction. (a)-(d) Images of point object; (e)-(h) intensity distributions in center line of images
    Performance metric convergence curves. (a) EE method; (b) MR method; (c) performance metric combination method
    Fig. 19. Performance metric convergence curves. (a) EE method; (b) MR method; (c) performance metric combination method
    ParameterTelescope aperture DT /cm

    Focal length

    f /m

    Wavelength λ /nm

    Pixel size

    s /μm

    Value2066333.3
    Table 1. Parameters in simulation
    Meirui Chen, Lü Jiang, Hongmin Mao, Huijuan Sun, Jiantao Peng, Guoding Xu, Lifa Hu, Huanjun Lu, Zhaoliang Cao. High-Precision Static Aberration Correction Method of SPGD Algorithm[J]. Acta Optica Sinica, 2023, 43(5): 0511001
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