• Laser & Optoelectronics Progress
  • Vol. 58, Issue 22, 2210014 (2021)
Hongbo Jia, Yunyu Shi*, Xiang Liu**, and Jingwen Zhao
Author Affiliations
  • School of Electronic and Electrical Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
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    DOI: 10.3788/LOP202158.2210014 Cite this Article Set citation alerts
    Hongbo Jia, Yunyu Shi, Xiang Liu, Jingwen Zhao. Low Illumination Image Enhancement Algorithm Based on Light Remapping[J]. Laser & Optoelectronics Progress, 2021, 58(22): 2210014 Copy Citation Text show less
    Flow chart of proposed algorithm
    Fig. 1. Flow chart of proposed algorithm
    Influence of exposure rate on images
    Fig. 2. Influence of exposure rate on images
    Influence of parameter tL on exposure matrix
    Fig. 3. Influence of parameter tL on exposure matrix
    Results of ablation experiment
    Fig. 4. Results of ablation experiment
    Comparison of enhancement effects of various algorithms
    Fig. 5. Comparison of enhancement effects of various algorithms
    DatasetWithout bilateral filterWith bilateral filter
    MEF5.30496.9870
    LIME5.30846.8904
    VV6.72197.0800
    DICM6.10066.7381
    Average5.85896.9013
    Table 1. Average information entropy
    DatasetWithout bilateral filterWith bilateral filter
    MEF10.612114.7098
    LIME14.000819.0866
    VV7.043910.1526
    DICM11.346815.6469
    Average10.750914.8989
    Table 2. Average gradient
    DatasetLIMERetinex-NetZero-DCELILR
    MEF3.57054.40733.28503.3173
    LIME4.09334.60123.76203.7232
    VV2.77722.68573.21532.5600
    DICM3.45964.40283.56663.7792
    Average3.47524.02433.45723.3449
    Table 3. Average NIQE
    DatasetLIMERetinex-NetZero-DCELILR
    MEF0.53331.86741.81520.3526
    LIME1.37445.66325.14290.6151
    VV8.829339.542834.37233.4371
    DICM0.94173.73813.34260.2965
    Average2.919612.702811.16821.1753
    Table 4. Average running time unit: s
    Hongbo Jia, Yunyu Shi, Xiang Liu, Jingwen Zhao. Low Illumination Image Enhancement Algorithm Based on Light Remapping[J]. Laser & Optoelectronics Progress, 2021, 58(22): 2210014
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