• Acta Optica Sinica
  • Vol. 34, Issue 3, 312006 (2014)
Deng Lijun1、*, Yang Yong1, Shi Bingchuan1, Ma Zhonghong1, Ge Qi2, and Zhai Hongchen1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: 10.3788/aos201434.0312006 Cite this Article Set citation alerts
    Deng Lijun, Yang Yong, Shi Bingchuan, Ma Zhonghong, Ge Qi, Zhai Hongchen. Refractive Index Distribution and Surface Profile Measurement of Micro-Optics Based on Dual Wavelength Digital Holography[J]. Acta Optica Sinica, 2014, 34(3): 312006 Copy Citation Text show less

    Abstract

    A method based on dual wavelength digital holography is proposed to measure the refractive index distribution and surface profile of micro-optics elements. Micro-optics elements are immersed in refractive index matching liquid to reduce the frequency of transmission light. The digital holograms of micro-optics elements are obtained under illumination of two different wavelengths, the refractive index distribution of micro-optics elements can be obtained according to phase distribution under two wavelengths. Surface profile of micro-optics elements can be calculated based on the refractive index distribution. Theoretical analysis and optical experimental results are performed to demonstrate its validity.
    Deng Lijun, Yang Yong, Shi Bingchuan, Ma Zhonghong, Ge Qi, Zhai Hongchen. Refractive Index Distribution and Surface Profile Measurement of Micro-Optics Based on Dual Wavelength Digital Holography[J]. Acta Optica Sinica, 2014, 34(3): 312006
    Download Citation