• Laser & Optoelectronics Progress
  • Vol. 51, Issue 8, 80401 (2014)
Liu Yi1、2、*, Zhou Qing1、2, and Yin Dayi1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop51.080401 Cite this Article Set citation alerts
    Liu Yi, Zhou Qing, Yin Dayi. Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80401 Copy Citation Text show less

    Abstract

    Charge overflow phenomenon will arise when CCD is receiving strong signals. With CCD without overflow drains, the parameters of the imaging system have to be set properly to avoid charge overflow. Based on the charge overflow phenomenon when using HAMAMATSU Frame-Transfer CCD to image not so strong targets, according to the paper, it is caused by the long-time charge accumulation of the image section during line readout process. To remove the overflow signal effectively, multiple frame transfers are carried out before integration time. Integrating sphere tests are also performed to testify the reason and the solution.
    Liu Yi, Zhou Qing, Yin Dayi. Analysis and Solution of Two-Phase FT-CCD Charge Overflow Phenomenon[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80401
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