• Microelectronics
  • Vol. 52, Issue 3, 454 (2022)
ZHOU Miao1, NI Xiaodong1, HE Yitao2, CHEN Chen3, and ZHOU Xin3、4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.220092 Cite this Article
    ZHOU Miao, NI Xiaodong, HE Yitao, CHEN Chen, ZHOU Xin. Study on a Lateral Insulated Gate Bipolar Transistor with Surface Superjunction[J]. Microelectronics, 2022, 52(3): 454 Copy Citation Text show less

    Abstract

    A surface superjunction lateral insulated gate bipolar transistor (SSJ LIGBT) based on bulk silicon was proposed. In order to improve the device performance, the effects of the parameters, injection dose and energy, were analyzed. The structure and the termination of SSJ LIGBT were designed and optimized due to the requirement of withstand voltage. The breakdown characteristics, output characteristics and transfer characteristics of the SSJ LIGBT were tested. The test results showed that the SSJ LIGBT had a voltage resistance of 693 V and a specific on-resistance of only 6.45 Ω·mm2.
    ZHOU Miao, NI Xiaodong, HE Yitao, CHEN Chen, ZHOU Xin. Study on a Lateral Insulated Gate Bipolar Transistor with Surface Superjunction[J]. Microelectronics, 2022, 52(3): 454
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