• Acta Optica Sinica
  • Vol. 30, Issue 10, 2776 (2010)
Zhao Yanguang*, Guo Xinlin, and Ren Mingfa
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos20103010.2776 Cite this Article Set citation alerts
    Zhao Yanguang, Guo Xinlin, Ren Mingfa. Lock-In Infrared Thermography for the Non-Destructive Testing of Fatigue Specimen with Defects[J]. Acta Optica Sinica, 2010, 30(10): 2776 Copy Citation Text show less
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    Zhao Yanguang, Guo Xinlin, Ren Mingfa. Lock-In Infrared Thermography for the Non-Destructive Testing of Fatigue Specimen with Defects[J]. Acta Optica Sinica, 2010, 30(10): 2776
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