• Journal of Infrared and Millimeter Waves
  • Vol. 20, Issue 2, 123 (2001)
[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2001, 20(2): 123 Copy Citation Text show less
    References

    [1] Kolner B H, Bloom D M. Electrooptic sampling in GaAs integrated circuits.IEEE J. Quantum Electron,1986,QE-22(1): 79

    [2] Weingarten K J, Rodwell M J W, Bloom D M. Picosecond optical sampling of GaAs integrated circuits.IEEE J.Quantum Electron,1988,QE-24(2): 198

    [3] Sirohi R S.A Course of Experiments with He-Ne Laser. New York: Hested Press, a Division of John Wiley and Sons, 1985,11

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2001, 20(2): 123
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