SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Journal of Infrared and Millimeter Waves >Volume 20 >Issue 2 >Page 123 > Article

Journal of Infrared and Millimeter Waves
Vol. 20, Issue 2, 123 (2001)

SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SPATIAL RESOLUTION OF ELECTROOPTIC SAMPLING WITH BACK-DIRECT SAMPLING STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2001, 20(2): 123 Copy Citation Text

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Abstract

The principle and method for measuring the spatial resolution of electrooptic sampling systems were introduced. According to the experimental results, the spatial resolution of the electrooptic sampling instrument established by the authors is 3μm.

Keywords

electrooptic sampling Gaussian distribution.spatial resolution

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