[1] K Lingadurai, R Nagarajan E, B Sundarakannan et al. J. Lumin, 177, 249(2016).

[2] W Chen G, B Li Y, C Qi W et al. Journal of Materials Science: Materials in Elecuronics, 29, 2841(2018).

[3] H Chung M, H Kim J. Journal of the Korean Physical Society, 72, 431(2018).

[4] H Chung M, J H Kim. Appl. Sci. Converg. Technol, 26, 26(2017).

[5] O Bordun I, M Bordun O, Y Kukharskyy I. Journal of Applied Spectroscopy, 84, 249(2017).

[6] M Chen Z, X Jiang S, J Xin B et al. Journal of Materials Science: Materials in Electronics, 29, 17795(2018).

[7] N Liao, L Shi, L Wang et al. Thin Solid Films, 518, 4817(2010).

[8] K Chong M, H Kam C, K Pita. Materials Chemistry and Physics, 100, 329(2006).

[9] H Cui, J Zhang, F Zhu P et al. J. Appl. Phys, 115, 023502(2014).

[10] D Den E, G Harris P, G Ireland T et al. J. Mater. Chem. C, 4, 8930(2016).

[11] G Kaptay. J. Nanosci. Nanotechnol, 12, 2625(2012).

[12] B Guo, A Navrotsky, P Zhang et al. J. Phys. Chem. C, 112, 932(2008).

[13] S Hu L, J Wen, M Yin et al. Current Applied Physics, 12, 732(2012).

[14] C Chang H, M Chang Y, W Wang J et al. Chemical Physics Letters, 405, 314(2005).

[15] M Chen Z, H Guo R, X Jing S et al. Materials Technology, 31, 7(2016).

[16] M Chen Z, X Jiang S, J Xin B et al. Journal of Materials Science: Materials in Electronics, 29, 837(2018).

[17] D Den E, R Fem G, G Ireland T et al. Nanotechnology, 29, 455703(2018).