Chao Lu, Wei Chen, Yin-Hong Luo, Li-Li Ding, Xun Wang, Wen Zhao, Xiao-Qiang Guo, Sai Li. Effect of source-drain conduction in single-event transient on nanoscaled bulk fin field effect transistor [J]. Acta Physica Sinica, 2020, 69(8): 086101-1
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