• Opto-Electronic Engineering
  • Vol. 34, Issue 8, 46 (2007)
[in Chinese]1、2, [in Chinese]1, [in Chinese]1, and [in Chinese]3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 3-D profilometry for the impact process with marked fringes tracking[J]. Opto-Electronic Engineering, 2007, 34(8): 46 Copy Citation Text show less
    References

    [1] Takeda Mitsuo,Mutoh Hideki,Kobayashi Seiji.Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry[J].Opt.Soc.Am,1982,72(1):156-160.

    [2] Takeda Mitsuo,Kazuhiro Mutoh.Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Applied optics,1983,22(24):3977-3982.

    [3] SU X Y,CHEN W J,ZHANG Q C.Dynamic 3-D shape measurement method based on FTP[J].Optics and Lasers in Engineering,2001,36(1):49-64.

    [5] ZHANG Q C,SU X Y.An optical measurement of vortex shape at a free surface[J].Optics and Laser Technology,2002,34(2):107-113

    [8] Gerchberg R W.Super-resolution through error energy reduction[J].Optic Acta,1974,21(9):709-720.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. 3-D profilometry for the impact process with marked fringes tracking[J]. Opto-Electronic Engineering, 2007, 34(8): 46
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