3-D profilometry for the impact process with marked fringes tracking

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 34 >Issue 8 >Page 46 > Article

Opto-Electronic Engineering
Vol. 34, Issue 8, 46 (2007)

3-D profilometry for the impact process with marked fringes tracking

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]¹, and [in Chinese]³

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. 3-D profilometry for the impact process with marked fringes tracking[J]. Opto-Electronic Engineering, 2007, 34(8): 46 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. 3-D profilometry for the impact process with marked fringes tracking[J]. Opto-Electronic Engineering, 2007, 34(8): 46

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