Jianguo Peng, Shu Yuan, Zhenyu Jin, Kaifan Ji. Accurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration[J]. Acta Optica Sinica, 2020, 40(9): 0912002
- Acta Optica Sinica
- Vol. 40, Issue 9, 0912002 (2020)
Fig. 1. Schematic diagram of the measurement system
Fig. 2. Photograph of the measurement system
Fig. 3. Condition number(cond J) of Jacobian matrix for measurement system
Fig. 4. Relationship between fitting random error and azimuth angle of polarization analyzer. (a) 90° wave plate; (b) 127° wave plate
Fig. 5. Measured random power noise of light source
Fig. 6. Simulation of random error on fitting parameter errors for measurement system. (a)(b) Random error of intensity; (c)(d) random error of positioning
Fig. 7. Fitting and residual of the nonlinear response for power meter. (a)(b) Linear fitting and residual; (c)(d) nonlinear fitting and residual
Fig. 8. Measurement results of quarter wave plate sample. (a) Fitting of intensity; (b) fitting residuals of intensity in two channels; (c) sum of two channel's residual; (d) intensity change of 10 measurements
Fig. 9. Measurement results when the beam passes through the rotation center of the sample. (a) Fitting of intensity; (b) fitting residuals of intensity in two channels; (c) sum of two channel's residual; (d) intensity change of 10 measurements
Fig. 10. Correlation between residuals in the two measurement channels. (a) Before alignment; (b) after alignment
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Table 1. System parameters obtained by fitting and Soleil compensation method
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