Accurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration

Jianguo Peng; Shu Yuan; Zhenyu Jin; Kaifan Ji

doi:10.3788/AOS202040.0912002

Journals >Acta Optica Sinica >Volume 40 >Issue 9 >Page 0912002 > Article

Acta Optica Sinica
Vol. 40, Issue 9, 0912002 (2020)

Accurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration

Jianguo Peng^1、2, Shu Yuan^1、*, Zhenyu Jin¹, and Kaifan Ji¹

Author Affiliations

¹Yunnan Observatories, Chinese Academy of Sciences, Kunming, Yunnan 650216, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.3788/AOS202040.0912002 Cite this Article Set citation alerts

Jianguo Peng, Shu Yuan, Zhenyu Jin, Kaifan Ji. Accurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration[J]. Acta Optica Sinica, 2020, 40(9): 0912002 Copy Citation Text

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Jianguo Peng, Shu Yuan, Zhenyu Jin, Kaifan Ji. Accurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration[J]. Acta Optica Sinica, 2020, 40(9): 0912002

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