• Infrared and Laser Engineering
  • Vol. 37, Issue 2, 270 (2008)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]*
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of electron irradiation on the GaN-based p-i-n UV detector[J]. Infrared and Laser Engineering, 2008, 37(2): 270 Copy Citation Text show less
    References

    [1] SHMIDT N M,DAVYDOV D V,EMTSEV V V,et al.Effect of annealing on defects in as-grown and γ-ray irradiated nGaN layers[J].Phys Slat Sol(b),1999,216:533-536.

    [2] WANG C W.SooNG B S,CHEN J Y.et al.Effects of Gamma-ray irradimion on the mierostructural and luminescent properties of radio-frequency-magnetron GaN thin films[J].J Appl Phys,2000,88(11):6355-6358.

    [3] GOODMAN S A,AURET F D,KOSCHNICK F K,et al.Radiation induced defects in MOVPE grown n-GaN[J].Mater Sd Eng,2000,B71:100-103.

    [4] UMANA-MEMBRENO G A,DELL J M,HESSLER T P,et al.60Co gamma-irradiation-induced defects in n-GaN[J].Appl Phys Lett,2002,80(23):4354-4356.

    [5] UMANA-MEMBRENO G A,DELL J M,PARISH G,et al.60Co Gamma irradiation effects on n-CraN schottky diodes[J].IEEE Tram Electron Devices,2003,50(12):2326-2334.

    [6] HOGSED M R,YEO Y K,AHOUJJA M,et al.Radiationinduced electron traps in A10.14Ga0.86N by 1 MeV electron radiation[J].Appi Phys LeR,2005,86(261906):1-3.

    [7] LI C.SUBRAMANIAN S.Neutron irradiation effects in GaNbased blue LEDs[J].IEEE Tram Nucl Sci,2003,50:1998-2002.

    [8] HU X W,KARMARKAR A P,JUN B,et al.Proton irradiatiOll effects on AIGaNIAlN/GaN high electron mobilitv transistors[J].IEEE Tram Nucl sci,2003,50:1791-1796.

    [9] IONASCUT-NEDELCESCU A,CARLONE C,HOUDAYER A,et al.Radiation hardness of gallium nitride[J].IEEE Tram Nuci Sci,2002,49(6):2733-2738.

    [10] CAI S J,TANG Y S,LI R,et al.Annealing behavior of a proton irradiated AlχGa1-χN/GaN high electron mobility transistor grown by MBE[J].IEEE Tram Electron Devices,2000,47:304-307.

    [11] LEGODI M J,HULLAVARAD S S,GOODMAN S A,et al.Defect characterization by DLTS of AIGaN UV Schottky photodetectors[J].Phys B,2001,308-310:1189.

    [12] WANG C W.Neutron inadiatijon effects on visible-blind Au/GaN Schonky barrier detectors grown on Si(111)[J].Appl Phys Lett,2002,80(9):1568-1570.

    [13] WANG C W.Neutron irradiation effect on radio-frequency magneffon-sputtered GaN thin films and Au/GaN Schottky diodes[J].J Vac sci Technoi B,2002,20(5):1821-1826.

    [14] CALLEJA E,SANCHEZ F J,BASAK D,et al.Yellow luminescence and mimed deep states in undoped GaN[J].Phys Rev B,1997,55:4689-4694.

    [15] BAE C,LUCOVSKY G.Low-temperature preparation of GaNSiO2 interfaces with low defect density.I.Two-step remote plasma-assisted oxidation-deposition process[J].J Vae Sci Tedmol A,2004,22(6):2402-2410.

    [16] BUYANOVA I A,WAGNER M,CGEN W M,et al.Photoluminescence of GaN:effect of electron irradiation[J].Appl Phys Lett,1998,73:2968-2970.

    [17] LoOK D C,FARLOW G C,DREVINSKY P J,et al.On the nitrogen vacancy in GaN[J].Appl Phys Lett,2003,83(17):3525-3527.

    [18] WANG R X,XU S J,BELING C D,et al.Micro-Raman and photoluminescence studies of neutron-irradiated gallium nitride epilayers[J].Appl Phys Lett,2005,87(031906):1-3.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of electron irradiation on the GaN-based p-i-n UV detector[J]. Infrared and Laser Engineering, 2008, 37(2): 270
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