• Infrared and Laser Engineering
  • Vol. 49, Issue 3, 0303009 (2020)
Hongwei Guo and Shuo Xing*
Author Affiliations
  • School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, China
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    DOI: 10.3788/IRLA202049.0303009 Cite this Article
    Hongwei Guo, Shuo Xing. Progress in self-correcting methods of projector nonlinearity for fringe projection profilometry[J]. Infrared and Laser Engineering, 2020, 49(3): 0303009 Copy Citation Text show less
    Software-based methods for correcting projector nonlinearities error
    Fig. 1. Software-based methods for correcting projector nonlinearities error
    Measurement system of fringe projection
    Fig. 2. Measurement system of fringe projection
    Effect of projector nonlinearity on the phase measuring results.(a) Simulated phase curve; (b) Simulated phases with a carrier added; (c) Nonlinearity curve of projector; (d) A phase-shifting intensity curve; (e) Measured phases without carrier;(f) Phase errors
    Fig. 3. Effect of projector nonlinearity on the phase measuring results.(a) Simulated phase curve; (b) Simulated phases with a carrier added; (c) Nonlinearity curve of projector; (d) A phase-shifting intensity curve; (e) Measured phases without carrier;(f) Phase errors
    (a) Calculated background intensities (dotted curve) and modulations (solid curve); (b) Normalized intensity curve
    Fig. 4. (a) Calculated background intensities (dotted curve) and modulations (solid curve); (b) Normalized intensity curve
    Self-correcting method based on iterative intensity curve fitting. (a) Smoothed phase curve ; (b) Phase difference before and after filtering; (c) Cosine of the smoothed phases; (d) Dependence between the normalized intensities and the cosine of smoothed phases; (e) Polynomial fitting to the clustering points in (d); (f) Corrected phases
    Fig. 5. Self-correcting method based on iterative intensity curve fitting. (a) Smoothed phase curve ; (b) Phase difference before and after filtering; (c) Cosine of the smoothed phases; (d) Dependence between the normalized intensities and the cosine of smoothed phases; (e) Polynomial fitting to the clustering points in (d); (f) Corrected phases
    Recognizing and removing the projector nonlinearity from a single phase map. (a) Wrapped smoothed phases; (b) Dependence of phase errors on phases; (c) Iterative fitting result of phase error function; (d) Corrected phases
    Fig. 6. Recognizing and removing the projector nonlinearity from a single phase map. (a) Wrapped smoothed phases; (b) Dependence of phase errors on phases; (c) Iterative fitting result of phase error function; (d) Corrected phases
    Correction of the projector nonlinearity from two-frequency phase maps. (a) Low frequency fringe; (b) Measured low frequency fringe phases; (c) High frequency fringe; (d) Measured high frequency fringe phases; (e) Phase errors in Fig.(b) (dotted) and Fig.(d) (solid); (f) Corrected phases
    Fig. 7. Correction of the projector nonlinearity from two-frequency phase maps. (a) Low frequency fringe; (b) Measured low frequency fringe phases; (c) High frequency fringe; (d) Measured high frequency fringe phases; (e) Phase errors in Fig.(b) (dotted) and Fig.(d) (solid); (f) Corrected phases
    (a) A fringe pattern; (b)Unwrapped phase map without carrier
    Fig. 8. (a) A fringe pattern; (b)Unwrapped phase map without carrier
    Depth maps of different correcting methods for projector nonlinearities. (a) Projector nonlinearity not corrected; (b) Photometric calibration;(c) Self-correcting methods based on iterative fitting of intensity curve[41]; (d) Phase error estimation from a single phase map[42]; (e) Self-correcting method based on statistics[45]; (f) Iterative least squares fitting method based on two-frequency phase maps[44]
    Fig. 9. Depth maps of different correcting methods for projector nonlinearities. (a) Projector nonlinearity not corrected; (b) Photometric calibration;(c) Self-correcting methods based on iterative fitting of intensity curve[41]; (d) Phase error estimation from a single phase map[42]; (e) Self-correcting method based on statistics[45]; (f) Iterative least squares fitting method based on two-frequency phase maps[44]
    Comparison among different compensating methods with the methods in (a)-(f) corresponding to those in Fig. 9(a)-(f)
    Fig. 10. Comparison among different compensating methods with the methods in (a)-(f) corresponding to those in Fig. 9(a)-(f)
    MethodsPrior calibration requiredNumber of the required fringe patternsComputational complexityInsensitivity to time-variance of the projector nonlinearityExpected accuracy
    Calibration-based methods (e.g. LUT and phase-error function) YesSmallLowHighMiddle
    Increasing the number of phase shifts with phase-shifting techniqueNoLargeLowLowHigh
    Iterative least squares fitting to the intensity curve based on single-frequency fringe patterns[41]NoSmallHighLowHigh
    Phase error estimation from a calculated phase map[42]NoSmallMiddleLowHigh
    Phase error estimation from two-frequency phase maps using iterative least squares fitting method[44]NoSmallMiddleLowHigh
    Phase error estimation from two-frequency phase maps using fringe statistics[45]NoSmallLowLowLow
    Table 1. Performance comparisons of projector nonlinearity correcting methods
    Hongwei Guo, Shuo Xing. Progress in self-correcting methods of projector nonlinearity for fringe projection profilometry[J]. Infrared and Laser Engineering, 2020, 49(3): 0303009
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