• Chinese Optics Letters
  • Vol. 13, Issue 2, 020502 (2015)
Yunlin Chen*, Tianwei Fan, and Man Tong
Author Affiliations
  • Institute of Applied Micro-Nano Materials, School of Science, Beijing Jiaotong University, Beijing 100044, China
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    DOI: 10.3788/COL201513.020502 Cite this Article Set citation alerts
    Yunlin Chen, Tianwei Fan, Man Tong. Diffractive self-imaging based on selective etching of a ferroelectric domain inversion grating[J]. Chinese Optics Letters, 2015, 13(2): 020502 Copy Citation Text show less
    Hexagonal array grating.
    Fig. 1. Hexagonal array grating.
    Numerical simulation TDSI (for Δφ=0.35π); (a)–(d) with respect to distance coefficient β=2, 3, 5, and 10; (e)–(h) with respect to distance coefficient β=0.10, 0.33, 0.50, and 0.70.
    Fig. 2. Numerical simulation TDSI (for Δφ=0.35π); (a)–(d) with respect to distance coefficient β=2, 3, 5, and 10; (e)–(h) with respect to distance coefficient β=0.10, 0.33, 0.50, and 0.70.
    Waveform for the 2D ferroelectric domain inversion MgLN.
    Fig. 3. Waveform for the 2D ferroelectric domain inversion MgLN.
    Fabricated MgLN domain inversion patterns; (a) optical microscope image; (b) SEM image.
    Fig. 4. Fabricated MgLN domain inversion patterns; (a) optical microscope image; (b) SEM image.
    Raman spectra collected at the original (noninverted) and domain inverted areas.
    Fig. 5. Raman spectra collected at the original (noninverted) and domain inverted areas.
    Experimental setup of diffraction self-imaging.
    Fig. 6. Experimental setup of diffraction self-imaging.
    Experimental TDSI patterns obtains (Δφ=0.35π); (a)–(d) on β=2, 3, 5, and 10 planes; (e)–(h) on β=0.10, 0.33, 0.50, and 0.70 planes.
    Fig. 7. Experimental TDSI patterns obtains (Δφ=0.35π); (a)–(d) on β=2, 3, 5, and 10 planes; (e)–(h) on β=0.10, 0.33, 0.50, and 0.70 planes.
    Yunlin Chen, Tianwei Fan, Man Tong. Diffractive self-imaging based on selective etching of a ferroelectric domain inversion grating[J]. Chinese Optics Letters, 2015, 13(2): 020502
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