• Acta Optica Sinica
  • Vol. 23, Issue 6, 641 (2003)
[in Chinese], [in Chinese], [in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Variational Approach to Analysis of Z-Scan in Thick Media With High Order Nonlinearity[J]. Acta Optica Sinica, 2003, 23(6): 641 Copy Citation Text show less
    References

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    [2] Sheik-Bahae M, Said A A, Hagan D J et al.. Nonlinear refraction and optical limiting in thick media. Opt. Engng., 1991, 30(8):1228~1235

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    [11] Tian J G. The modified Z-scan method with simplicity and enhanced sensitivity. Optik, 1995, 98(3):143~145

    [12] Kershaw S V. Analysis of the EZ-scan measurement technique. J. Mod. Opt., 1995, 42(7):1361~1366

    [13] Shy-Mou Chen, Pan R P, Pan C L. Identification of third and fifth order self-phase nodulation effects in laser-induced diffraction rings from a nematic liquid crystal. Opt. Commun., 1990, 79(6):469~472

    [14] Zhan Chuanliang, Li Dehua, Wang Duoyuan et al.. The high fifth-order nonlinearity in a new stilbazolium derivative: trans-1-[p-(p-dimethylaminobenzyl-azo)-benzyl]-2-(N-methyl-4-pyridinium)-ethene iodide. Chem. Phys. Lett., 2001, 347(26):410~414

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    [16] Ekvall K, Lundevall C, Meulen P van der. Studies of the fifth-order nonlinear susceptibility of ultraviolet-grade fused silica. Opt. Lett., 2001, 26(12):896~898

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Variational Approach to Analysis of Z-Scan in Thick Media With High Order Nonlinearity[J]. Acta Optica Sinica, 2003, 23(6): 641
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