Enhanced optical nonlinearity in a silicon–organic hybrid slot waveguide for all-optical signal processing

Yonghua Wang; Su He; Xiaoyan Gao; Piaopiao Ye; Lei Lei; Wenchan Dong; Xinliang Zhang; Ping Xu

doi:10.1364/PRJ.439251

Journals >Photonics Research >Volume 10 >Issue 1 >Page 50 > Article

Photonics Research
Vol. 10, Issue 1, 50 (2022)

Enhanced optical nonlinearity in a silicon–organic hybrid slot waveguide for all-optical signal processing

Yonghua Wang¹, Su He¹, Xiaoyan Gao², Piaopiao Ye¹, Lei Lei^1、4、*, Wenchan Dong^{2、3、5、*}, Xinliang Zhang^2、3, and Ping Xu¹

Author Affiliations

¹College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China

²School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China

³Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China

⁴e-mail: leilei@szu.edu.cn

⁵e-mail: wcdong@hust.edu.cn

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DOI: 10.1364/PRJ.439251 Cite this Article Set citation alerts

Yonghua Wang, Su He, Xiaoyan Gao, Piaopiao Ye, Lei Lei, Wenchan Dong, Xinliang Zhang, Ping Xu. Enhanced optical nonlinearity in a silicon–organic hybrid slot waveguide for all-optical signal processing[J]. Photonics Research, 2022, 10(1): 50 Copy Citation Text

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(a) Schematic diagram of the highly nonlinear SOHSW. (b) Normalized electric field distribution and (c) corresponding normalized magnitude of the SOHSW. (d) Evolution of the nonlinear coefficient γ with various slot widths for different waveguide widths.

Fig. 1. (a) Schematic diagram of the highly nonlinear SOHSW. (b) Normalized electric field distribution and (c) corresponding normalized magnitude of the SOHSW. (d) Evolution of the nonlinear coefficient γ with various slot widths for different waveguide widths.

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(a) Experimental setup for the Z-scan measurement. (b) Closed aperture scan of a 0.8 μm thick MEH-PPV film with 1 mm thick fused silica substrate. (c) Open aperture scan of the MEH-PPV film for absorption measurement. (d) Closed aperture scan of a 1 mm thick fused silica substrate.

Fig. 2. (a) Experimental setup for the Z-scan measurement. (b) Closed aperture scan of a 0.8 μm thick MEH-PPV film with 1 mm thick fused silica substrate. (c) Open aperture scan of the MEH-PPV film for absorption measurement. (d) Closed aperture scan of a 1 mm thick fused silica substrate.

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Fig. 3. (a) Illustration of the device fabrication steps of the presented SOHSW. (b) Scanning electron microscopy images of the fabricated device.

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Fig. 4. (a) Experimental setup used to measure the nonlinear coefficients. (b) FWM spectra of the SOHSW (red curve) and bare silicon slot waveguide (blue curve). (c) FWM spectra of the SOHSW (red curve) and strip waveguide (220 nm×450 nm, blue curve).

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Fig. 5. Experimental setup for the 40 Gb/s all-optical logic canonical units based on the SOHSW.

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Fig. 6. Measured FWM spectrum achieved at the output of SOHSW.

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Fig. 7. Temporal waveforms and eye diagrams of the original signals and logical results.

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Fig. 8. Bit error rate (BER) measurements for the original signals and logic operations.

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Material	$n$	$n_{2}$ ( $m^{2} / W$ )	$A_{eff}$ ( ${μm}^{2}$ )
MEH-PPV	1.65	$4.5 \times 10^{- 17}$	0.019133
Si	3.48	$5.3 \times 10^{- 18}$	0.120470
${SiO}_{2}$	1.48	$4.7 \times 10^{- 20}$	0.051590

Table 1. Parameters Used to Calculate the Effective Nonlinear Coefficient of the SOHSW

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Input Power (μW)	$L$ (μm)	$α$ ( ${μm}^{- 1}$ )	$z_{0}$ (mm)	$I_{0}$ ( $GW / {cm}^{2}$ )
95.6	0.8	0.13	1.66	29.1

Table 2. Experimental Parameters for the Closed Aperture Scan

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Waveguide	$L$ (mm)	$Δ β$ ( $m^{- 1}$ )	$P_{p}$ (dBm)	$α$ ( $m^{- 1}$ )	$η$	$γ$ ( $W^{- 1} {km}^{- 1}$ )
SOHSW	3	4.56	19	767	0.0018	$1.43 \times 10^{6}$
Slot waveguide	3	10.53	18.5	732	0.0001	$3.52 \times 10^{5}$
Strip waveguide	3	−0.80	17	87	0.0005	$2.5 \times 10^{5}$

Table 3. Parameters Used to Calculate γ of the Three Waveguides

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