• Journal of Inorganic Materials
  • Vol. 38, Issue 4, 437 (2023)
Tongyu WANG1, Haofeng RAN1, and Guangdong ZHOU1,2,*
Author Affiliations
  • 11. College of Artificial Intelligence, Southwest University, Chongqing 400715, China
  • 22. Chongqing Key Laboratory of Brain-like Computing and Intelligent Control, Southwest University, Chongqing 400715, China
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    DOI: 10.15541/jim20220721 Cite this Article
    Tongyu WANG, Haofeng RAN, Guangdong ZHOU. Defect-induced Analogue Resistive Switching Behavior in FeOx-based Memristor and Synaptic Paired-pulse Facilitation Feature [J]. Journal of Inorganic Materials, 2023, 38(4): 437 Copy Citation Text show less
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    Tongyu WANG, Haofeng RAN, Guangdong ZHOU. Defect-induced Analogue Resistive Switching Behavior in FeOx-based Memristor and Synaptic Paired-pulse Facilitation Feature [J]. Journal of Inorganic Materials, 2023, 38(4): 437
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