• Opto-Electronic Engineering
  • Vol. 43, Issue 1, 55 (2016)
JIANG Chunguang1、2、*, CHEN Yaqin2, LIU Tao2, XIONG Wei2, LI Guoguang2, and JI Feng1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2016.01.010 Cite this Article
    JIANG Chunguang, CHEN Yaqin, LIU Tao, XIONG Wei, LI Guoguang, JI Feng. All-reflective Broadband Spectroscopic Imaging Ellipsometer[J]. Opto-Electronic Engineering, 2016, 43(1): 55 Copy Citation Text show less
    References

    [1] ZHAO Yuan,SHENG Mingyu,ZHENG Yuxiang,et al. Accurate analysis of ellipsometric data for thick transparent films [J]. Chinese Optics Letters(S1671-7694),2011,9(5):053101.

    [2] JIN Gang,Tengvall P,Lundstr m I,et al. A Biosensor Concept Based on Imaging Ellipsometry for Visualization of biomolecular interactions [J]. Analytical Biochemistry(S0003-2697),1995,232(1):69-72.

    [3] JIN Gang,Jansson R,Arwin H. Imaging ellipsometry revisited:Developments for visualization of thin transparent layers on silicon substrates [J]. Review of Scientific Instruments(S0034-6748),1996,67(8):2930-2936.

    [4] SONG Guozhi,CHEN Yaqin,LIU Tao,et al. DUV broadband spectroscopic ellipsometer based onall-reflective focusing optical system [C]// Instrumentation,Measurement,Computer,Communication and Control (IMCCC),Shenyang, China,Sep 21-23,2013:492-495.

    [5] Tompkins H G,Irene E A. Handbook of Ellipsometry [M]. Berlin:Springer,2005:1-855.

    [6] XU Peng,LIU Tao,WANG Linzi,et al. Calibration method for single wavelength ellipsometer using standard samples [J]. Acta Optica Sinica,2013,33(4):0412002.

    [7] JIN Gang,CHEN Yanyan. Refractive index and thickness analysis of natural silicon dioxide film growing on silicon with variable-angle spectroscopic ellipsometry [J]. Spectroscopy(S0887-6703),2006,21(10):26-31.

    JIANG Chunguang, CHEN Yaqin, LIU Tao, XIONG Wei, LI Guoguang, JI Feng. All-reflective Broadband Spectroscopic Imaging Ellipsometer[J]. Opto-Electronic Engineering, 2016, 43(1): 55
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