Ren-Yan WANG, Lin GAN, Tian-You ZHAI, [in Chinese], [in Chinese], and [in Chinese]
. (a) The model unitcell view of ReS
2[33]; (b) Top view of the crystalline structure of distorted-1T phase of monolayer ReX
2(Black balls represent Re atoms and yellow balls represent S or Se atoms); (c, d) Schematic images of 1T lattice symmetries and energy levels of d-orbital electrons induced by the crystal field
[39,40]; (e) First-principles scalar relativistic projector augmented wave calculations of electronic band structures for bulk (top) and single-layer (down) ReSe
2[50]; (f) Band structure of monolayer, trilayer and five-layer ReS
2 by ab initio-calculations
[51] . PL spectra of ReS
2 flakes with different number of layers; (b) Integrated PL intensity as a function of number of layers (normalized to that of monolayer) in ReS
2, MoS
2, MoSe
2, WS
2 and WSe
2[50]; Raman spectra recorded on (c) N-layer ReS
2 and (d) N-layer ReSe
2 in the parallel polarization configuration
[58]; (e) Schematic for the process of oriented self assembly of ReS
2 nanoscrolls
[59]; (f) Schematic for the TIB of a single ReS
2 nanowall
[60] . (a) SEM image of ReS
2 powders and TEM image of as-exfoliated ReS
2 nanosheets with inset showing photograph of a typical dark-brown exfoliated ReS
2 suspension in water; (b) High-resolution STEM image of as-exfoliated ReS
2 nanosheets
[70]; (c) Schematics for different density gradient ultracentrifugation ReS
2 nanosheets through iDGU; (d) Atomic force microscopy image of solution-processed ReS
2 following deposition on a Si wafer; (e) Raman spectrum of ReS
2 nanosheets
[63] . (a) Schematic diagram of synthesized ReS
2 film by PVD; (b) Raman spectrum of ReS
2 film ; (c) Optical photograph of grown ReS
2 film on the SiO
2/Si substrate with inset showing the AFM and TEM images
[88]; (d) A picture of bare and as-grown ReS
2 bilayer film on sapphire wafer by CVD; (e) Optical microscope image of the ReS
2 hexagons
[74] . (a) Schematic for the tellurium-assisted CVD growth approach; (b) Optical image of ReS
2 after transferred onto SiO
2/Si (300 nm) substrate with inset showing AFM image of ReS
2 on mica substrate
[77]; (c) Schematic of the CVD growth of ReSe
2 in the confined reaction space and the surface reaction during the epitaxial growth of the ReSe
2 atomic layer on mica; (d) Optical image of ReSe
2 in A and B face
[89] . (a) A schematic illustrating the pump-probe experiment of few-layer ReS
2 with inset showing optical image of few-layer ReS
2; (b) Polarization-dependent absorption spectra of few-layer ReS
2; (c) Corresponding spectral weights of Lorentzian contributions of X
1 (blue dots) and X
2(red dots). Yellow line represents the
b-axis
[122]; (d) Raman spectrum for bulk ReS
2[128] and Low-frequency Raman spectroscopy of few layer ReS
2[131]; (e) Unpolarized Raman spectra as a function of sample orientation angle; (f) High-magnification ADF-STEM image and corresponded polarization-and orientation-resolved Raman spectra
[130] . (a) Optical microscope image of ReS
2 four probe transistor; (b) The magnified ADF images taken from the sample in (a); (c) The direction-dependent
I-
V characteristics with inset showing nonlinear
I-
V behavior indicate the Schottky Au/ReS
2 contacts; (d) The direction-dependent transfer characteristics
[137]; (e) Transfer curves of anisotropic ReS
2 FETs along two sides with top inset showing optical image of the devices (Scale bar, 10 μm) and low inset showing the 4-probe resistance of the same devices. (f) Normalized field-effect mobility of a six-layer device with inset showing the optical image of the device
[51]; (g) Angle-dependent transfer curves of ReS
1.23Se
0.77 alloy device with inset showing optical image of ReS
2 device
[76] . (a) The photocurrent of ReS
2 change as a function of drain bias under different polarization light illuminations; (b) The change of the photocurrent under different drain biases plotted as a function of polarization angle
[112]; (c) Photocurrent response of ReS
1.06Se
0.94 alloy device under light on and off irradiation, and under light with different polarization direction; (d) Polar plots for the photocurrent with respect to the polarization angle of the incident light
[76]; (e) Schematic structure of ReSe
2 photodetectors; (f) The SEM image and polarization-dependent photocurrent mapping of the device
[15] . (a) Optical microscopy image of an exfoliated ReS
2 ?ake; (b) Through-plane TDTR data at two modulation frequencies; (c) In-plane TDTR data at
f = 1.1 MHz and time delay of -50 ps. The dashed lines are the intensity profile of the laser beam; (d) 2D beam-offset scan of the TDTR signal; (e) In-plane thermal conductivity of exfoliated ReS
2 ?akes as a function of thickness
[151] Materials | a/nm | b/nm | c/nm | α/(°) | β/(°) | γ/(°) | V/nm3 |
---|
ReS2 | 0.6417 | 0.6510 | 0.6461 | 121.10 | 88.38 | 106.47 | 0.21930 | ReSe2 | 0.6603 | 0.6717 | 0.6718 | 91.87 | 104.93 | 118.95 | 0.24753 |
|
Table 1. Original unit-cell lattice parameters of ReS
2 and ReSe
2[36,37] Symmetry | Bulk/cm-1 | Monolayer/cm-1 | Origin of phonon mode |
---|
Ag | 140.3 | 139.2 | Out-of-plane vibrations of Re atoms | Ag | 145.9 | 145.3 | Out-of-plane vibrations of Re atoms | Eg | 153.1 | 153.6 | In-plane vibrations of Re atoms | Eg | 163.6 | 163.6 | In-plane vibrations of Re atoms | Eg | 217.2 | 217.7 | In-plane vibrations of Re atoms | Eg | 237.1 | 237.7 | In-plane vibrations of Re atoms | Cp | 278.3 | 278.3 | In- and out-of-plane vibration of Re and S atoms | Cp | 284.2 | 284.7 | In- and out-of-plane vibration of Re and S atoms | Eg | 307.8 | 307.8 | In-plane vibrations of S atoms | Eg | 311.0 | 311.0 | In-plane vibrations of S atoms | Cp | 320.6 | 320.6 | In- and out-of-plane vibration of S atoms | Cp | 324.9 | 324.9 | In- and out-of-plane vibration of S atoms | Cp | 348.8 | 348.8 | In- and out-of-plane vibration of S atoms | Cp | 368.9 | 369.5 | In- and out-of-plane vibration of S atoms | Cp | 377.9 | 377.4 | In- and out-of-plane vibration of S atoms | Cp | 407.3 | 408.3 | In- and out-of-plane vibration of S atoms | Ag | 418.7 | 419.3 | Out-of-plane vibrations of S atoms | Ag | 438.0 | 437.5 | Out-of-plane vibrations of S atoms |
|
Table 2. The 18 Raman active frequencies in bulk and monolayer ReS
2 under 633 nm solid state laser excitation
[35]