Ping Xie, Bin Li, Suying Zhang, Dingquan Liu, "Using lead germanium telluride as a high-index coating material in the mid-wavelength infrared narrow bandpass filters," Chin. Opt. Lett. 13, 123101 (2015)
- Chinese Optics Letters
- Vol. 13, Issue 12, 123101 (2015)
Fig. 1. Measured spectral transmittance curves of thin films; a spectrum of the silicon substrate is also presented in order to make a comparison.
Fig. 2. Optical constants of thin films evaporated from the starting materials with a Ge concentration x
Fig. 3. Summary of measured spectral transmittance curves for the sapphire wafer, silicon wafer, Ge wafer, Pb 1 − x Ge x Te
Fig. 4. Transmission spectrum of the narrowband filter fabricated using Pb 1 − x Ge x Te
Fig. 5. Standard adhesion tests are performed on the filters using Pb 1 − x Ge x Te
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Table 1. Summary for Element Concentrations in Thin Films
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