Silicon nitride-based Kerr frequency combs and applications in metrology

Zhaoyang Sun; Yang Li; Benfeng Bai; Zhendong Zhu; Hongbo Sun

doi:10.1117/1.AP.4.6.064001

Journals >Advanced Photonics >Volume 4 >Issue 6 >Page 064001 > Article

Advanced Photonics
Vol. 4, Issue 6, 064001 (2022)

Silicon nitride-based Kerr frequency combs and applications in metrology | Author Presentation

Zhaoyang Sun¹, Yang Li^1,*, Benfeng Bai^1,*, Zhendong Zhu², and Hongbo Sun^1,*

Author Affiliations

¹Tsinghua University, State Key Laboratory of Precision Measurement and Instruments, Department of Precision Instrument, Beijing, China

²National Institute of Metrology, Beijing, China

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DOI: 10.1117/1.AP.4.6.064001 Cite this Article Set citation alerts

Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun, "Silicon nitride-based Kerr frequency combs and applications in metrology," Adv. Photon. 4, 064001 (2022) Copy Citation Text

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Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun, "Silicon nitride-based Kerr frequency combs and applications in metrology," Adv. Photon. 4, 064001 (2022)

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