Silicon nitride-based Kerr frequency combs and applications in metrology

Zhaoyang Sun; Yang Li; Benfeng Bai; Zhendong Zhu; Hongbo Sun

doi:10.1117/1.AP.4.6.064001

Journals >Advanced Photonics >Volume 4 >Issue 6 >Page 064001 > Article

Advanced Photonics
Vol. 4, Issue 6, 064001 (2022)

Silicon nitride-based Kerr frequency combs and applications in metrology

Zhaoyang Sun¹, Yang Li^1、*, Benfeng Bai^1、*, Zhendong Zhu², and Hongbo Sun^1、*

Author Affiliations

¹Tsinghua University, State Key Laboratory of Precision Measurement and Instruments, Department of Precision Instrument, Beijing, China

²National Institute of Metrology, Beijing, China

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DOI: 10.1117/1.AP.4.6.064001 Cite this Article Set citation alerts

Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun. Silicon nitride-based Kerr frequency combs and applications in metrology[J]. Advanced Photonics, 2022, 4(6): 064001 Copy Citation Text

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Zhaoyang Sun, Yang Li, Benfeng Bai, Zhendong Zhu, Hongbo Sun. Silicon nitride-based Kerr frequency combs and applications in metrology[J]. Advanced Photonics, 2022, 4(6): 064001

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