• Acta Optica Sinica
  • Vol. 44, Issue 2, 0231001 (2024)
Ge Zhang1、2, Yun Cui1、2、*, Jiaoling Zhao1、2、**, Tao Wang1、2, and Yuan'an Zhao1、2
Author Affiliations
  • 1Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    DOI: 10.3788/AOS231519 Cite this Article Set citation alerts
    Ge Zhang, Yun Cui, Jiaoling Zhao, Tao Wang, Yuan'an Zhao. Effect of Sample Tilting Angle on the Characterization of Nanofilms by Transmission Electron Microscopy[J]. Acta Optica Sinica, 2024, 44(2): 0231001 Copy Citation Text show less
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    Ge Zhang, Yun Cui, Jiaoling Zhao, Tao Wang, Yuan'an Zhao. Effect of Sample Tilting Angle on the Characterization of Nanofilms by Transmission Electron Microscopy[J]. Acta Optica Sinica, 2024, 44(2): 0231001
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