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    Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 19 >Page 1900003 > Article
    • Laser & Optoelectronics Progress
    • Vol. 58, Issue 19, 1900003 (2021)
    Failure Mechanism and Detection Analysis of Semiconductor Laser
    Tianyu Sun1, Mingjun Xia1、*, and Lei Qiao2
    Author Affiliations
  • 1College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou , Zhejiang 310027, China
  • 2ZTE Corporation, Shenzhen , Guangdong 518057, China
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    DOI: 10.3788/LOP202158.1900003 Cite this Article Set citation alerts
    Tianyu Sun, Mingjun Xia, Lei Qiao. Failure Mechanism and Detection Analysis of Semiconductor Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1900003 Copy Citation Text show less
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    Article index updated: May. 24, 2024
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    Tianyu Sun, Mingjun Xia, Lei Qiao. Failure Mechanism and Detection Analysis of Semiconductor Laser[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1900003
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    Paper Information
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